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Ultra Nanoindentation Tester (UNHT)

 

Ultra Nanoindenter, Hardness and Elastic Modulus Tester

//// THE NEW GENERATION OF NANOINDENTER

CSM Instruments has introduced a new nano range high resolution nanoindenter with ultra low thermal drift. When used per ISO 14577 test methods the Ultra Nano Hardness Tester will provide the most accurate data of any instruments on the market.

This new nanoindentation instrument, is based on the principle of using an axis of measurement and an axis of reference, each one having its own actuator and its own sensors of depth and force. It is therefore possible to carry out active referencing of the surface of the sample.

The nano indentation technique is known as Depth-Sensing Indentation (DSI), as the penetration depth is continuously monitored as a function of load during the instrumented indentation test. This technique has been largely used to evaluate mechanical properties of materials at the nanoscale level, especially hardness and elastic modulus. Given the range of depths (nm) and forces (µN) involved, the highest accuracy of the measured penetration depth and applied force over time is therefore essential for this method. Accuracy and precision of the data are assured by having the lowest thermal drift currently available of any instrumented nanoindenter.

 

Features

  • Active top referencing (Patented Design)
    The reference is removable and can be of different shapes (ball, pin, etc). The reference has its own piezo actuator and load sensor and applies a very small controlled (servo loop) load on the sample.
  • Thermal drift free
    The head is constructed out of ZeroDur® glass and the electronics system has a drift rate of ≈ 1ppm/°C.
  • Highest load frame stiffness
    Thanks to the marble base platform, the choice of materials (ZeroDur) and the patented active top referencing.
  • Two independent depth and load sensors
    Ultra high resolution capacitive sensors for True Depth and Load Control modes.
  • Ultra high resolution and very low noise floor
    Depth resolution: 0.001 nm, noise floor ≈ 0.1nm
    Force resolution: 0.01 μN, noise floor ≈ 0.5mN
  • Perfect positional synchronization
    The Ultra Nanoindentation Tester is perfectly “positionally synchronized” with a high quality optical video microscope and/or an optional Atomic Force Microscope (AFM). The combination of the Ultra Nanoindentation Tester head, the optical microscope and the AFM objective provides great flexibility and ease-of-use, as well as accurate three-dimensional imaging at the nanometer scale.
  • Compliant to ISO 14577 and ASTM E2546
    CSM Instruments produces instruments and measurements that conform perfectly to ISO and ASTM standards

Options

  • Vacuum or environmental control enclosure
  • Acoustic damping enclosure
  • Atomic Force Microscope
  • High resolution sample stage (0.25um accuracy)
  • High resolution camera

 

CSM Ultra Nanoindentation Tester technical poster to download

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Products catalogs
Indentation Catalog
Application Bulletin n°31

This paper will explain with different applications the advantages of the new generation of CSM Nanoindenter called Ultra Nanoindentation Tester
Application Bulletin n°29

Mechanical Properties of Cementitious Materials
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